| Date |
Time |
Event |
| Aug. 10th |
8:00 am |
Introduction; Gun-Woong Bahng, Korea Research Institute of Standards and Science |
| 8:05 am |
Opening Remarks; Kwang Hwa Chung, Korea Research Institute of Standards and Science |
| 8:10 am |
Opening Remarks; Anne Plant; National Institute of Standards and Technology |
| 8:15 am |
Group Photo |
Session 1: Nanometrology for Science and Technology I (Lake Anne A)
Session Chair: Gun-Woong Bahng (KRISS) |
| Aug. 10th |
8:20 am - 9:10 am |
1.1 Scanning Tunneling Microscopy of Low-Dimensional Systems
Jason Crain, National Institute of Standards and Technology (Keynote Speech) |
1.2 Use of Carbon Nanotube Probe in Critical Dimensional Atomic Force Microscope
B. C. Park*1, J. Choi1, S. J. Ahn1, D.-H. Kim1, L. Joon2, G. Orji3, R. Dixon3, T. Vorgurger3; 1 Research Institute of Standards and Science, Korea, 3 National Institute of Standards and Technology |
1.3 Measurement of Impurity Atoms Incorporated in Si (001) by Scanning Tunneling Microscopy
Ja-Yong Koo, Korea Research Institute of Standards and Science |
Session 2: Nanometrology for Science and Technology II
(Lake Anne A)
Session chair: Jeeseong Hwang (NIST)
Theodore V. Vorburger (NIST) |
| Aug. 10th |
9:45 am - 10:55 am |
2.1 Nano- and Atomic-scale Length Metrology
Theodore V. Vorburger*, R. G. Dixon, J. Fu, N. G. Orji, S. C. Feng, M. W. Cresswell, R. A. Allen, W. G. Guthrie, W. Chu, National Institute of Standards and Technology, USA |
2.2 Nano-Bio Convergence at KRISS for Analysis of Single Devices and Single Cells
Dae Won Moon, Korea Research Institute of Standards and Science, Korea (“Keynote speech 2”) |
2.3 Nanoscale Mechanical Properties of Collagen Determine Vascular Smooth Muscle Cell Phenotype
Anne L. Plant*, Kiran Bhadriraju, Gordon Shaw, Koo-Hyung Chung, John T. Elliott, National Institute of Standards and Technology, USA |
2.4 SIntegrated Approaches for the Metrology of Single Nanocrystals toward Quantitative Biomedical Applications
HyeonGon Kang, Peter Yim, Matthew Clarke, Kimberly Briggman, Jeeseong Hwang *; National Institute of Standards and Technology, USA
(Department of Civil and Environmental Engineering, KAIST, Daejeon, Korea) |
Session 3: Nanometrology for Science and Technology III
(Lake Anne A)
Session chair: Dae Won Moon (KRISS) |
| Aug. 10th |
2:15 pm - 3:45 pm |
3.1 Sensors and Memories Based on Nanoelectronic Devices
Wan Soo Yun*, Jinhee Kim, Dong Han Ha, Korea Research Institute of Standards and Science, Korea |
3.2 Application of SIMS for Nano-metrology
Greg Gillen, National Institute of Standards and Technology, USA |
3.3 Reliable Thickness Measurement of SiO2 Films Thinner Than 1 nm by XPS
Kyungjoong Kim, Korea Research Institute of Standards and Science, Korea |
3.4 Development of a Ultra Low Temperature Scanning Tunneling Microscope with 15 T Magnetic Field
Young Jae Song*, S. R. Blankenship, J. N. Crain, J. A. Stroscio, National Institute of Standards and Technology, USA |
Discussion
(including future collaborations between KRISS and NIST) |
Session 4: Metrology for Quality of Life I (Lake Anne A)
Session chair: Yong Ki Park (KRISS), Katherine Sharpless (NIST) |
| Aug. 10th |
4:00 pm - 5:40 pm |
4.1 NIST CRMs and Quality of Life
Katherine Sharpless*, Stephen Wise, National Institute of Standards and Technology, USA |
4.2 Metrology for Food and Environment in KRISS
Tae Soon Park, Korea Research Institute of Standards and Science, Korea |
4.3 Research Activities of Health Metrology Group in KRISS
Se Jin Park, Korea Research Institute of Standards and Science, Korea |
4.4 Bio-signal Measurement and Applications to Medical Science in KRISS
Yong Ki Park Korea Research Institute of Standards and Science, Korea |
4.5 Research Activities of Safety Metrology Group in KRISS
Bongyoung Ahn, Korea Research Institute of Standards and Science, Korea |
| Closing |
